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Challenges in the size analysis of a silica nanoparticle mixture as candidate certified reference material.

Temmerman; Jan Mast; Junjie, Liu; Babick, Frank; Cölfen, Helmut; Emons, Hendrik Source: J Nanopart Res, Volume 18, p.171 (2016) Abstract: A new certified reference material for quality control of nanoparticle ...

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