<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Pieter-Jan De Temmerman</style></author><author><style face="normal" font="default" size="100%">Lammertyn, Jeroen</style></author><author><style face="normal" font="default" size="100%">De Ketelaere, Bart</style></author><author><style face="normal" font="default" size="100%">Kestens, Vikram</style></author><author><style face="normal" font="default" size="100%">Roebben, Gert</style></author><author><style face="normal" font="default" size="100%">Eveline Verleysen</style></author><author><style face="normal" font="default" size="100%">Jan Mast</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Measurement uncertainties of size, shape, and surface measurements using transmission electron microscopy of near-monodisperse, near-spherical nanoparticles</style></title><secondary-title><style face="normal" font="default" size="100%">Journal of Nanoparticle Research</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">Transmission electron microscopy Method validation Reference material Silica nanoparticles Measurement uncertainty Nanometrology</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2014</style></year><pub-dates><date><style  face="normal" font="default" size="100%">Jan-01-2014</style></date></pub-dates></dates><volume><style face="normal" font="default" size="100%">16492008221027594757410103241512943</style></volume><language><style face="normal" font="default" size="100%">eng</style></language><issue><style face="normal" font="default" size="100%">133624524212031</style></issue></record></records></xml>