Zoekresultaten - 2 results

Method validation of nanomaterial characterization by single particle ICP-MS, DLS and quantitative TEM analyses. Final report NanoVAL.

Publication Type: Sci. report, recommendat°, guidance doc., directive, monograph Authors: Bozatzidis,V; Delfosse,L.; Evrard, Annick; Nadia Waegeneers Source: CODA-CERVA, Brussels, Belgium, p.NA (2016) Accession Number: NA Keywords: DLS ICP-MS nanomaterial ...

Physical Characterization of Nanomaterials in Dispersion by Transmission Electron Microscopy in a Regulatory Framework

particles on the grid is discussed. The application of TEM imaging methods, electron diffraction and analytical TEM to obtain complementary information on the size, morphology, crystallographic structure, ...

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